Subject: Re: [PATCH] compat/mingw.h: Set S_ISUID to prevent a fast-import test failure

From: Johannes Sixt <[email-masked]>
Date: Tue, 01 May 2012 21:44:15 +0200

Am 01.05.2012 16:30, schrieb Junio C Hamano:
> Johannes Sixt<[email-masked]>  writes:
>
>>> ...
>>> -#define S_ISGID 0
>>> -#define S_ISVTX 0
>>> +
>>> +#define S_ISUID 0004000
>>> +#define S_ISGID 0002000
>>> +#define S_ISVTX 0001000
>>>
>>>   #define WIFEXITED(x) 1
>>>   #define WIFSIGNALED(x) 0
>>
>> I've submitted a similar patch, but it was suggested to solve the
>> inherent problem in a cleaner way, but no patch came forward.
>
> I think this patch should be fine, either as the final solution, or the
> first step for "solving the inherent problem in a cleaner way" (if msysgit
> folk care very deeply about it, that is).

My primary concern is to have the bug fixed on Windows. For this purpose, 
this patch is sufficiently clean.

-- Hannes