Subject: Re: [PATCH net-next] test_bpf: extend tests for 32-bit endianness conversion

From: Daniel Borkmann <[email-masked]>
Date: Sat, 27 Jun 2015 11:14:40 +0200

On 06/26/2015 05:25 PM, Xi Wang wrote:
> Currently "ALU_END_FROM_BE 32" and "ALU_END_FROM_LE 32" do not test if
> the upper bits of the result are zeros (the arm64 JIT had such bugs).
> Extend the two tests to catch this.
>
> Cc: Alexei Starovoitov <[email-masked]>
> Signed-off-by: Xi Wang <[email-masked]>

Thanks for extending the test suite!

Acked-by: Daniel Borkmann <[email-masked]>